Kuen-Ting Shiu

Title: Kuen-Ting Shiu: Innovator in Optical Inspection Technology

Introduction

Kuen-Ting Shiu is a notable inventor based in Cranbury, NJ, who has made significant contributions to the field of optical inspection technology. With a focus on enhancing the accuracy and efficiency of feature comparison in image data, Shiu's work has implications for various industries.

Latest Patents

Shiu holds a patent for an innovative system titled "Optical inspection based on repetitive feature comparison." This computer-based system quantifies attributes of features indicated by image data, such as color, shape, material, and texture. The system is designed to modify image data to highlight instances of features when their quantified attributes exceed a certain threshold. This functionality allows for the classification of units as defective, non-defective, or potentially defective based on the modified image data.

Career Highlights

Throughout his career, Kuen-Ting Shiu has demonstrated a commitment to advancing optical inspection technologies. His patent reflects a deep understanding of image processing and feature analysis, showcasing his ability to innovate in a competitive field.

Collaborations

Shiu has worked alongside talented colleagues, including Frederick Seng and Harold Y Hwang, contributing to a collaborative environment that fosters innovation and creativity.

Conclusion

Kuen-Ting Shiu's contributions to optical inspection technology exemplify the impact of innovative thinking in engineering. His patent not only enhances the capabilities of image analysis but also sets a foundation for future advancements in the field.