The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 14, 2025
Filed:
Aug. 01, 2022
Lg Innotek Co., Ltd., Seoul, KR;
Frederick Seng, Cranbury, NJ (US);
Harold Hwang, Cranbury, NJ (US);
Brian Piccione, Cranbury, NJ (US);
Kuen-Ting Shiu, Cranbury, NJ (US);
LG INNOTEK CO., LTD., Seoul, KR;
Abstract
A computer-based system may quantify, based on the plurality of instances of a feature indicated by image data, an attribute (e.g., a color, a shape, a material, a texture, etc.) of the plurality of instances of the feature. The system may also quantify an attribute of an instance of the feature of the plurality of instances of the feature. The system may modify the image data to indicate the instance of the feature if/when a value of the quantified attribute of the instance of the feature exceeds a value of the quantified attribute of the plurality of instances of the feature by a threshold. Functionality (e.g., defective, non-defective, potentially defective, etc.) of the unit may be classified based on the modified image data.