Singapore, Singapore

Kuan Soon Oong

This inventor holds 2 USPTO granted patents. Top assignee: Hewlett-Packard Development Company, L.p.. Active years: 2013-2022.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Kuan Soon Oong. Retrieved from https://idiyas.com/inventor/kuan-soon-oong

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 9(Granted Patents)


Company Filing History:


Years Active: 2013-2022

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2 patents (USPTO):Explore Patents

Title: Kuan Soon Oong: Innovator in Scanning Technology

Introduction

Kuan Soon Oong is a notable inventor based in Singapore, SG. He has made significant contributions to the field of scanning technology, holding a total of 2 patents. His work focuses on enhancing the functionality and efficiency of scanning devices.

Latest Patents

One of Kuan Soon Oong's latest patents is titled "Lid position determinations based on scans of zones." This invention involves scanning a first zone and a second zone of a scan surface using an image sensor. A lid, which can be in an open or closed position, covers these zones when closed. The position of the lid is determined by comparing scans of both zones, allowing for improved accuracy in scanning operations.

Career Highlights

Kuan Soon Oong is currently employed at Hewlett-Packard Development Company, L.P., where he continues to innovate and develop new technologies. His work at HP has allowed him to contribute to advancements in printing and scanning solutions.

Collaborations

Kuan Soon Oong has collaborated with talented individuals such as Chun Long Goh and Kiran Kattesomanahalli Shanthamallappa. These collaborations have fostered a creative environment that encourages innovation and the development of new ideas.

Conclusion

Kuan Soon Oong is a distinguished inventor whose work in scanning technology has led to valuable patents and advancements in the field. His contributions continue to impact the industry positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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