Seoul, South Korea

Ku-Young Jung

This inventor holds 1 USPTO granted patent. Top assignee: Samsung Sds Co., Ltd.. Active years: 2020.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Ku-Young Jung. Retrieved from https://idiyas.com/inventor/ku-young-jung

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2020

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1 patent (USPTO):Explore Patents

Title: Innovations by Ku-Young Jung

Introduction

Ku-Young Jung is a notable inventor based in Seoul, South Korea. He has made significant contributions to the field of service monitoring systems. His innovative approach has led to the development of a unique patent that enhances the efficiency of service monitoring.

Latest Patents

Ku-Young Jung holds a patent for a "System and method for monitoring service." This invention provides a service monitoring system that includes a service apparatus designed to convert text information corresponding to functional blocks of a target service into abbreviated keys. The system also includes a monitoring server that receives tables containing this information to acquire profiling data regarding the functional blocks.

Career Highlights

Ku-Young Jung is currently employed at Samsung SDS Co., Ltd., where he applies his expertise in developing advanced service monitoring solutions. His work has been instrumental in improving service efficiency and reliability.

Collaborations

He collaborates with talented coworkers, including Woo-Jin Park and Jae-Jin Kim, who contribute to the innovative projects at Samsung SDS Co., Ltd.

Conclusion

Ku-Young Jung's contributions to service monitoring technology exemplify the impact of innovation in enhancing service efficiency. His patent reflects a commitment to advancing technology in this field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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