Warsaw, Poland

Krzystof Marasek

This inventor holds 1 USPTO granted patent. Top assignee: Sony Deutschland Gmbh. Active years: 2010.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Krzystof Marasek. Retrieved from https://idiyas.com/inventor/krzystof-marasek

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 12(Granted Patents)


Company Filing History:


Years Active: 2010

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1 patent (USPTO):Explore Patents

Title: Krzystof Marasek: Innovator in Emotion Detection Technology

Introduction

Krzystof Marasek is a notable inventor based in Warsaw, Poland. He has made significant contributions to the field of emotion detection technology. His innovative approach focuses on understanding human emotions through spoken speech input.

Latest Patents

Krzystof holds a patent for a method titled "Method for detecting emotions involving subspace specialists." This patent outlines a technique to detect and determine the current emotional state (CES) of a human being from spoken speech input (SI). The method involves identifying first and second feature classes with distinct dimensions of an underlying emotional manifold (EM) or emotional space (ES).

Career Highlights

Krzystof is currently employed at Sony Deutschland GmbH, where he continues to develop cutting-edge technologies. His work is instrumental in advancing the understanding of human emotions through technology.

Collaborations

Krzystof collaborates with talented individuals such as Raquel Tato and Thomas Kemp. Their combined expertise contributes to the innovative projects at Sony.

Conclusion

Krzystof Marasek is a pioneering inventor whose work in emotion detection technology is shaping the future of human-computer interaction. His contributions are vital in bridging the gap between technology and emotional understanding.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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