This inventor holds 1 USPTO granted patent. Top assignee: Akademia Gorniczo-Hutnicza Im. Stanislawa Staszica. Active years: 2026.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2026
Title: Krystian Strzalka and X-Ray Detector Readout Innovation.
Introduction
Krystian Strzalka is an inventor associated with Akademia Górniczo-Hutnicza im. Stanisława Staszica in Poland. His patent work concerns signal processing in hybrid pixel array detectors used for X-ray detection.
Latest Patents
Strzalka is named on 1 patent: “Circuit and Method for X-Ray Induced Voltage Pulse Amplitude Estimation in Pixel Readout Channel.” The invention describes a circuit that estimates the amplitude of an X-ray-induced voltage pulse within a pixel readout channel. A charge-sensitive amplifier converts the current pulse from a pixel electrode into a voltage pulse, and an analog-to-digital converter samples the signal and produces a codeword. An artificial neural network then processes the sampled data to estimate the pulse amplitude. The design combines detector readout circuitry with neural-network processing.
Career Highlights
The available information connects Strzalka’s patent activity with Akademia Górniczo-Hutnicza im. Stanisława Staszica. His disclosed invention addresses the measurement and interpretation of signals generated in X-ray detector pixels.
Collaborations
Strzalka’s listed coworkers include Anna Koziol and Piotr Maj. The patent’s technical focus reflects collaborative work in detector electronics and signal estimation.
Conclusion
Krystian Strzalka’s patent documents an approach to estimating X-ray pulse amplitudes by combining analog circuitry, digital sampling, and artificial neural-network processing.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile