Zoersel, Belgium

Kristof Van Dyck

This inventor holds 1 USPTO granted patent, plus 1 CIPO patent. Top assignee: Arcelormittal. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Kristof Van Dyck. Retrieved from https://idiyas.com/inventor/kristof-van-dyck

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0


Average Co-Inventor Count = 7.0

ph-index = 1


Company Filing History:


Years Active: 2026

Loading Chart...
Loading Chart...
1 patent (USPTO):Explore Patents

Title: Kristof Van Dyck: Inventor in Metal-Coating Technology.

Introduction

Kristof Van Dyck is an inventor associated with Zoersel, Belgium, and ArcelorMittal. His work includes an invention for continuous hot-dip coating of metallic strips.

Latest Patents

Van Dyck is associated with 1 patent: “Apparatus and Method for Dip Coating a Metal Strip Using a Moveable Overflow.” The patent describes equipment for continuously hot-dip coating a metallic strip. It includes an annealing furnace, a tank containing a liquid metal bath, and a snout that connects the furnace to the bath. The strip passes through the snout in a protective atmosphere, while its immersed tip forms a liquid seal. A movable support system carries an overflow connected by connecting means, with at least one vat and one pump.

Career Highlights

Van Dyck’s patent addresses equipment and methods for managing the coating process in continuous metal-strip production. The invention’s movable overflow system is a central feature of the described apparatus.

Collaborations

The provided information lists Bert Van Nieuwenhuyze and Whoudhouh Memni as coworkers.

Conclusion

Kristof Van Dyck’s recorded patent concerns continuous hot-dip coating and a movable overflow system, reflecting his association with industrial metal-processing innovation at ArcelorMittal.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…