Forest City, IA, United States of America

Kristin M Mikes

This inventor holds 2 USPTO granted patents and 2 published patent applications. Top assignee: 3M Innovative Properties Company. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Kristin M Mikes. Retrieved from https://idiyas.com/inventor/kristin-m-mikes

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 2 

% Patents Active = 100.0

Average Co-Inventor Count = 11.0

ph-index = 1


Company Filing History:


Years Active: 2025

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2 patents (USPTO):Explore Patents

Title: Kristin M Mikes: Innovator in Aerial Lift Safety Technology

Introduction

Kristin M Mikes is a notable inventor based in Forest City, IA (US). She has made significant contributions to the field of safety technology, particularly in aerial lifts. With a total of 2 patents, her work focuses on enhancing safety measures for users of aerial lifts.

Latest Patents

Kristin's latest patents include an innovative design for an aerial lift that is interlocked with a fall-protection safety apparatus. This aerial lift is equipped with a monitoring system that detects whether a connector of a safety line appears to be connected to a safety harness of the user. This design aims to prevent accidents and ensure the safety of individuals operating aerial lifts.

Career Highlights

Kristin M Mikes is associated with 3M Innovative Properties Company, where she continues to develop and refine her inventions. Her work is characterized by a commitment to improving safety standards in the industry.

Collaborations

Some of her coworkers include Jonathan J Lepp and Christopher J Reineke, who contribute to her innovative projects and help bring her ideas to fruition.

Conclusion

Kristin M Mikes stands out as a dedicated inventor whose work in aerial lift safety technology is paving the way for safer operational practices. Her contributions are vital in enhancing safety measures in the industry.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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