Lafayette, CA, United States of America

Kris R Efland

This inventor holds 1 USPTO granted patent. Top assignee: Amazon Technologies, Inc.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Kris R Efland. Retrieved from https://idiyas.com/inventor/kris-r-efland

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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Average Co-Inventor Count = 1.0


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Kris R. Efland and Remote-Sensing Image Upsampling.

Introduction

Kris R. Efland is an inventor based in Lafayette, California, and is associated with Amazon Technologies, Inc. His patent work addresses the use of machine learning to improve the resolution of remote-sensing imagery.

Latest Patents

Efland is named on one patent, titled “Image Upsampling System for Remote Sensing Data.” The invention describes training a machine-learning model with crowdsourced high-resolution images, such as dashcam and cellphone photographs, alongside lower-resolution remote-sensing images of the same geographic areas. After training, the model can apply the learned approach to produce higher-resolution versions of new remote-sensing images. The patent record provided identifies 1 patent.

Career Highlights

Efland’s listed work at Amazon Technologies, Inc. connects his inventive contribution to machine-learning methods for processing geographic imagery. The disclosed system aims to make remote-sensing data more detailed by drawing on high-resolution images collected from other sources.

Collaborations

Anirudh Viswanathan is identified as Efland’s coworker. The information provided does not specify whether Viswanathan collaborated on this patent.

Conclusion

Kris R. Efland’s patent describes a machine-learning approach to enhancing remote-sensing images by learning from crowdsourced photographs of the same locations.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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