Paradise, UT, United States of America

Kris K Payne

This inventor holds 1 USPTO granted patent. Top assignee: Campbell Scientific, Inc.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Kris K Payne. Retrieved from https://idiyas.com/inventor/kris-k-payne

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Kris K. Payne and Photovoltaic Soiling Monitoring

Introduction

Kris K. Payne is an inventor based in Paradise, Utah, and works at Campbell Scientific, Inc. His patent work addresses monitoring soiling on monofacial and bifacial photovoltaic panels, helping assess how accumulated dirt and debris affect solar-module output.

Latest Patents

Payne is associated with 1 patent, titled “Sensors and Methods for Monitoring Soiling on Monofacial and Bifacial Photovoltaic Panels.” The invention describes systems and methods for monitoring soiling on one or more photovoltaic modules.

The sensor includes a measure chamber and a clean chamber. Cells in the measure chamber provide readings affected by soiling, while reference cells in the clean chamber can be exposed to incident light to establish a clean-output measurement. Comparing the readings helps determine the power loss attributable to soiling.

Career Highlights

Payne’s patent reflects work on practical measurement systems for photovoltaic installations. By distinguishing soiling-related losses from clean operating output, the technology can support monitoring and maintenance decisions for solar panels.

Collaborations

Payne’s listed coworkers include Ajay Singh and James Richards. His professional affiliation is Campbell Scientific, Inc.

Conclusion

Kris K. Payne’s patented sensor approach provides a method for estimating soiling losses in photovoltaic modules by comparing affected measurements with a clean reference output.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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