This inventor holds 1 USPTO granted patent. Top assignee: Other. Active years: 2002.
Company Filing History:
1 out of 834,350 Years Active: 2002
Title: Krag Allander: Innovator in Detection Technology
Introduction
Krag Allander is a notable inventor based in Los Alamos, NM (US). He has made significant contributions to the field of detection technology, particularly through his innovative patent that enhances the accuracy of emission determinations.
Latest Patents
Krag Allander holds a patent for a groundbreaking apparatus and method that allows for simultaneous determinations of both alpha and beta emissions using a simple detector structure. This technique employs a beta detector covered in an electrically conducting material, which discharges ions generated by alpha emissions. As a result, it provides a measure of those alpha emissions. Additionally, the technique offers improved mountings for alpha detectors and other forms of detectors, addressing the issues of vibration and its effects on measurement accuracy. He has 1 patent to his name.
Career Highlights
Throughout his career, Krag has focused on developing technologies that improve detection methods. His work has been instrumental in advancing the capabilities of detectors, making them more reliable and efficient in various applications.
Collaborations
Krag has collaborated with notable colleagues, including Craig Janson Luff and Thomas Dockray. Their combined expertise has contributed to the success of their projects and innovations in detection technology.
Conclusion
Krag Allander's contributions to detection technology through his innovative patent demonstrate his commitment to advancing the field. His work continues to influence the development of more accurate and reliable detection methods.