Tokyo, Japan

Kozo Maeda

This inventor holds 1 USPTO granted patent. Top assignees: Nkk Corporation, Other. Active years: 2000.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Kozo Maeda. Retrieved from https://idiyas.com/inventor/kozo-maeda-gm6jvs92

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 6.0

ph-index = 1

Forward Citations = 68(Granted Patents)


Company Filing History:

goldMedal1 out of 614 
 
Nkk Corporation
 patents
silverMedal1 out of 834,570 
Other
 patents
where one patent can have more than one assignee

Years Active: 2000

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1 patent (USPTO):Explore Patents

Title: Kozo Maeda: Innovator in Magnetic Flaw Detection

Introduction

Kozo Maeda is a notable inventor based in Tokyo, Japan. He has made significant contributions to the field of magnetic flaw detection technology. His innovative approach has led to the development of a unique patent that enhances the capabilities of magnetic sensors.

Latest Patents

Maeda holds a patent for a "Magnetic flaw detection apparatus using an E-shaped magnetic sensor." This invention showcases his expertise in creating advanced detection systems that improve the accuracy and efficiency of flaw detection processes.

Career Highlights

Throughout his career, Kozo Maeda has worked with NKK Corporation, a prominent company in the engineering and manufacturing sector. His experience at NKK Corporation has allowed him to apply his innovative ideas in practical settings, contributing to the advancement of technology in his field.

Collaborations

Maeda has collaborated with notable individuals such as Akio Nagamune and Hiroharu Kato. These partnerships have fostered a creative environment that has led to the development of groundbreaking technologies.

Conclusion

Kozo Maeda's contributions to magnetic flaw detection technology exemplify his innovative spirit and dedication to advancing engineering solutions. His patent and collaborations highlight his role as a key figure in the field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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