This inventor holds 21 USPTO granted patents, primarily in Image Formation Technology. Top assignees: Minolta Company, Ltd., Minolta Camera Kabushiki Kaisha, Kabushiki Kaisha Inoac Corporation. Active years: 1987-2001.
IDiyas Innovation Intelligence. (2026). Inventor Profile: Kouji Matsushita. Retrieved from https://idiyas.com/inventor/kouji-matsushita
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Calculating rank
% Patents Active = 100.0
Average Co-Inventor Count = 2.6
ph-index = 7
Forward Citations = 197(Granted Patents)
Location History:
- Osaka, JP (1989 - 1998)
- Toyokawa, JP (1987 - 2001)
Company Filing History:
12 out of 2,816 
Minolta Company, Ltd.
9 out of 2,979 Minolta Camera Kabushiki Kaisha
1 out of 11 Kabushiki Kaisha Inoac Corporation
where one patent can have more than one assignee
Years Active: 1987-2001
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Areas of Expertise:
Imaging Cartridge
Corona Discharge
Liquid Spreading
Conductive Material
Image Formation
Charging Device
Electrostatic Development
Copying Machine
Automatic Density Control
Electrophotographic
21 patents (USPTO):Explore Patents
Couldn't find inventor
Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
IDiyas Innovation Intelligence. (2026). Inventor Profile: Kouji Matsushita. Retrieved from https://idiyas.com/inventor/kouji-matsushita
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]