Tenri, Japan

Kouji Iwamori

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Sharp Semiconductor Innovation Corporation. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Kouji Iwamori. Retrieved from https://idiyas.com/inventor/kouji-iwamori

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Kouji Iwamori: Optical Sensing and Distance Measurement

Introduction

Kouji Iwamori is an inventor associated with Tenri, Japan, and Sharp Semiconductor Innovation Corporation. His patent work focuses on optical sensing and calculating the distance to an object from reflected light.

Latest Patents

The provided information lists one patent for Iwamori: “Optical Sensor, Electronic Device, Distance Calculation Method, and Storage Medium of Program.” The invention describes an optical sensor that emits light toward an area containing an object and receives light reflected from it. A generation unit creates a histogram relating the time between light emission and reception to the intensity of the received light. The sensor calculates the histogram’s skewness and uses it, together with the histogram, to determine the distance between the sensor and the object. Iwamori is credited with 1 patent.

Career Highlights

Iwamori’s listed invention addresses distance measurement using reflected light and histogram analysis. The provided information associates him with Sharp Semiconductor Innovation Corporation.

Collaborations

Norikazu Okada and Mami Tanaka are identified as Iwamori’s coworkers. The available details do not specify their roles in the patent or the extent of their collaboration.

Conclusion

Kouji Iwamori’s listed patent combines optical sensing with histogram skewness analysis to calculate object distance, reflecting his work in sensor technology at Sharp Semiconductor Innovation Corporation.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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