Tokyo, Japan

Kouichirou Saitou

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Hitachi High-Tech Corporation. Active years: 2021.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Kouichirou Saitou. Retrieved from https://idiyas.com/inventor/kouichirou-saitou

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1


Company Filing History:


Years Active: 2021

Loading Chart...
1 patent (USPTO):Explore Patents

Title: The Innovations of Kouichirou Saitou

Introduction

Kouichirou Saitou is a prominent inventor based in Tokyo, Japan. He is known for his significant contributions to the field of electron microscopy. His innovative work has led to advancements that enhance the capabilities of electron microscopes.

Latest Patents

Saitou holds a patent for an electron microscope that aims to capture images at higher speeds and magnifications. The invention includes a first spherical receiver fixed to the column of the electron microscope, designed to slide with a spherical fulcrum at the tip of a sample holder. Additionally, it features a spherical surface part on the column and a second spherical receiver located outside the column. This design minimizes view and focus shifts from the observation position of a sample, thereby improving image acquisition.

Career Highlights

Kouichirou Saitou has made notable strides in his career, particularly through his work at Hitachi High-Tech Corporation. His expertise in electron microscopy has positioned him as a key figure in the development of advanced imaging techniques.

Collaborations

Saitou has collaborated with esteemed colleagues such as Hideki Kikuchi and Tadao Furutsu. Their combined efforts have contributed to the advancement of technologies in the field of electron microscopy.

Conclusion

Kouichirou Saitou's innovative contributions to electron microscopy exemplify the impact of dedicated inventors in advancing scientific technology. His work continues to influence the field and enhance imaging capabilities.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…