Yono, Japan

Kouichi Watanabe

This inventor holds 2 USPTO granted patents. Top assignee: Moritex Corporation. Active years: 1999-2000.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Kouichi Watanabe. Retrieved from https://idiyas.com/inventor/kouichi-watanabe-5tvg1f1p

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 2

Forward Citations = 51(Granted Patents)


Location History:

  • Urawa, JP (1999)
  • Yono, JP (2000)

Company Filing History:


Years Active: 1999-2000

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2 patents (USPTO):Explore Patents

Title: Kouichi Watanabe: Inventor of Imaging Technologies.

Introduction

Kouichi Watanabe is an inventor associated with Yono, Japan, and Moritex Corporation. His work includes inventions in optical imaging and microscope technology. He holds 2 patents.

Latest Patents

Watanabe’s listed patents include “CCD Microscope,” which describes a microscope using two polarized-light illumination systems with perpendicular vibration directions. An analyzer and CCD device capture images that distinguish surface conditions from internal features based on changes in the light’s polarization.

His other listed patent, “Image Capture Instrument with Side View Angle,” describes an instrument that captures an image through a side-facing window. Mirrors or prisms direct and reinvert the optical image before a focusing system projects it onto a CCD element.

Career Highlights

Watanabe’s patent work reflects an emphasis on optical systems that capture and process images from different viewing angles and distinguish details through polarized light. His listed inventions are associated with Moritex Corporation.

Collaborations

The provided information identifies Junichi Arai and Yuhkoh Morito as Watanabe’s coworkers. It does not specify their roles in the listed patents or describe particular joint projects.

Conclusion

Kouichi Watanabe’s two listed patents showcase contributions to microscope and side-view imaging technologies, with his work connected to Moritex Corporation.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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