Location History:
- Ama-gun, JP (2006)
- Kasugai, JP (2013 - 2015)
Company Filing History:
Years Active: 2006-2015
Title: Kouichi Miyashita: Innovator in Filter Inspection Technology
Introduction
Kouichi Miyashita is a notable inventor based in Kasugai, Japan. He has made significant contributions to the field of filter inspection technology, holding a total of 3 patents. His innovative methods enhance the efficiency and sensitivity of detecting defects in filters.
Latest Patents
Miyashita's latest patents include a filter inspection method and a filter inspection apparatus. The filter inspection method is designed to be highly sensitive in detecting defects within a filter while also improving operational efficiency. This method involves a humidifying step where a porous filter is exposed to moisture-containing air. Following this, a detecting step introduces water particles into the filter in a wet state, allowing for the detection of any water particles that pass through and flow out of the filter, thereby identifying defects.
Another significant patent is a method for inspecting defects in an article to be inspected. This method consists of several steps, including supplying a particle-containing gas to one end face of the inspection target under pressure. A first laser beam is applied to the vicinity of the other end face, and the end face is photographed from a vertical position. This process is repeated with a second laser beam, and defects are specified based on the photographic results obtained.
Career Highlights
Kouichi Miyashita is currently employed at NGK Insulators, Inc., where he continues to develop innovative solutions in filter inspection technology. His work has been instrumental in advancing the methods used in this field.
Collaborations
Miyashita has collaborated with notable coworkers, including Akio Enomoto and Tatsuhiko Hatano. Their combined expertise contributes to the innovative projects at NGK Insulators, Inc.
Conclusion
Kouichi Miyashita's contributions to filter inspection technology through his patents demonstrate his commitment to innovation and excellence in his field. His work not only enhances operational efficiency but also sets a new standard for defect detection in filters.