The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 14, 2006
Filed:
Feb. 12, 2002
Akio Enomoto, Chita-gun, JP;
Kouichi Miyashita, Ama-gun, JP;
Akio Enomoto, Chita-gun, JP;
Kouichi Miyashita, Ama-gun, JP;
NGK Insulators, Ltd., Nagoya, JP;
Abstract
An inspection method for detecting a defect in a test object. A particulate is generated, then the generated particulate is introduced into a test object. Subsequently, light having high directivity is emitted such that the light passes in the vicinity of the test object to irradiate the particulate discharged from the test object, thereby making the particulate visible. An inspection apparatus for detecting a defect in a test object, including a particulate generator, a particulate introducing device which introduces the particulate into a test object, and a high directional light emitter emitting light passing in the vicinity of the test object and irradiating the particulate discharged from the test object to visualize the particulate. The inspection method and apparatus can detect a defect with high sensitivity and shorten an inspection time and a post-treatment time.