Taipei, Taiwan

Kou-Yuan Yuan

This inventor holds 1 USPTO granted patent. Top assignee: Fortune Semiconductor Corporation. Active years: 2007.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Kou-Yuan Yuan. Retrieved from https://idiyas.com/inventor/kou-yuan-yuan

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2007

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1 patent (USPTO):Explore Patents

Title: Kou-Yuan Yuan: Innovator in Digital Power Meter Technology

Introduction

Kou-Yuan Yuan is a notable inventor based in Taipei, Taiwan. He has made significant contributions to the field of digital power measurement technology. His innovative approach has led to the development of a unique digital power meter apparatus.

Latest Patents

Kou-Yuan Yuan holds a patent for a "Digital power meter apparatus and method for the same." This invention involves processing input voltage and current signals through dual channels to obtain a digital power signal that is proportional to the product of the two input signals. The method includes multiple stages of signal processing, ensuring accurate and efficient power measurement.

Career Highlights

Kou-Yuan Yuan is currently associated with Fortune Semiconductor Corporation, where he applies his expertise in semiconductor technology and power measurement. His work has been instrumental in advancing the capabilities of digital power meters.

Collaborations

Some of his notable coworkers include Yi-Chou Huang and Arthur Shaoyan Rong. Their collaboration has contributed to the innovative environment at Fortune Semiconductor Corporation.

Conclusion

Kou-Yuan Yuan's contributions to digital power measurement technology exemplify the impact of innovation in the semiconductor industry. His patent reflects a commitment to enhancing the accuracy and efficiency of power measurement systems.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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