Kobe, Japan

Kosuke Yamaguchi

This inventor holds 1 USPTO granted patent. Top assignee: Sysmex Corporation. Active years: 2017.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Kosuke Yamaguchi. Retrieved from https://idiyas.com/inventor/kosuke-yamaguchi-h85wwh16

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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% Patents Active = 100.0

Average Co-Inventor Count = 4.0

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Company Filing History:


Years Active: 2017

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1 patent (USPTO):Explore Patents

Title: Kosuke Yamaguchi: Inventor of a Sample Analyzer

Introduction

Kosuke Yamaguchi is an inventor associated with Kobe, Japan, and Sysmex Corporation. His work includes a patent for a sample analyzer designed to help laboratories determine how many samples can be analyzed with the available reagents.

Latest Patents

Yamaguchi is named on 1 patent, titled “Sample analyzer.” The invention calculates and displays the number of analyzable samples by accounting for the reagent tests remaining and the tests needed for control measurements. When creating a calibration curve, the calculation also accounts for reagent tests required for calibrator measurements. This approach is intended to provide a more accurate estimate of the analyzer’s remaining sample capacity.

Career Highlights

Yamaguchi’s patent work is associated with Sysmex Corporation, a company known for developing laboratory testing and diagnostic technologies. The sample analyzer invention addresses a practical operational need: helping users understand reagent availability before proceeding with sample analysis.

Collaborations

Yamaguchi’s listed coworkers include Tsukasa Hirata and Shoichiro Asada. They are also associated with the sample analyzer patent.

Conclusion

Kosuke Yamaguchi’s patent reflects a focused contribution to laboratory analysis by improving how an analyzer estimates and communicates the number of samples that can be processed with available reagents.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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