Location History:
- Ayabe, JP (2008 - 2013)
- Nantan, JP (2013 - 2020)
- Kyoto, JP (2020)
Company Filing History:
Years Active: 2008-2020
Title: Innovations of Kosuke Sugiyama
Introduction
Kosuke Sugiyama is a notable inventor based in Nantan, Japan. He has made significant contributions to the field of measurement technology, holding a total of 8 patents. His work focuses on developing devices that enhance measurement accuracy and convenience.
Latest Patents
One of his latest innovations is an inclination measuring device. This device is designed to provide excellent convenience in measuring angles. It includes an optical system that irradiates a measurement object with light and receives reflected rays from the measurement surface. The device also features a light receiving unit with a spectroscope to separate the reflected light into wavelength components, along with a processor that calculates the inclination angle based on the reflected light rays.
Another significant patent is for a sensor head that increases installation flexibility. This sensor head is used for measuring the displacement of a measurement object. It incorporates a diffractive lens that generates chromatic aberration and is housed within a cylindrical case. The design allows for easy fixing to various objects, enhancing its usability in different applications.
Career Highlights
Kosuke Sugiyama is currently employed at Omron Corporation, a leading company in automation and measurement technology. His work at Omron has allowed him to develop innovative solutions that address complex measurement challenges.
Collaborations
He collaborates with talented coworkers, including Naoki Nishimori and Mariko Marukawa. Their combined expertise contributes to the advancement of measurement technologies within the company.
Conclusion
Kosuke Sugiyama's contributions to measurement technology through his patents demonstrate his innovative spirit and dedication to improving measurement devices. His work continues to influence the field and enhance the capabilities of measurement systems.