Kanagawa, Japan

Kosuke Kitahara

USPTO Granted Patents = 4 

Average Co-Inventor Count = 4.3

ph-index = 1

Forward Citations = 3(Granted Patents)


Company Filing History:


Years Active: 2021-2023

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4 patents (USPTO):Explore Patents

Title: Innovations of Kosuke Kitahara

Introduction

Kosuke Kitahara is a notable inventor based in Kanagawa, Japan. He has made significant contributions to the field of strain gauge technology, holding a total of four patents. His work is recognized for its innovative approach and practical applications in various industries.

Latest Patents

One of his latest patents involves a strain gauge that includes a flexible substrate, a resistor formed of material containing at least one from among chromium and nickel, and a pair of electrodes electrically connected to the resistor. Each electrode features a plurality of first patterns that are juxtaposed at predetermined intervals and are electrically connected to each other. Additionally, a plurality of second patterns, whose longitudinal directions align with those of the first patterns, are disposed between opposing electrodes. Another patent describes a strain gauge that consists of a flexible substrate and resistors formed of a Cr composite film. This design includes a first and second resistor on one side of the substrate, and a third and fourth resistor on the opposite side, collectively forming a Wheatstone bridge circuit.

Career Highlights

Kosuke Kitahara is currently employed at Minebea Mitsumi Inc., where he continues to develop innovative technologies. His work has significantly impacted the field of sensor technology, particularly in the design and functionality of strain gauges.

Collaborations

He has collaborated with notable colleagues such as Eiji Misaizu and Shigeyuki Adachi, contributing to advancements in their respective fields.

Conclusion

Kosuke Kitahara's contributions to strain gauge technology exemplify his innovative spirit and dedication to advancing engineering solutions. His patents reflect a commitment to enhancing the functionality and efficiency of measurement devices.

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