Kariya, Japan

Kosuke Hirano

This inventor holds 1 USPTO granted patent. Top assignee: Aisin Seiki Kabushiki Kaisha. Active years: 2020.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Kosuke Hirano. Retrieved from https://idiyas.com/inventor/kosuke-hirano-as4o0enz

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2020

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1 patent (USPTO):Explore Patents

Title: Kosuke Hirano: Inventor in Kariya, Japan.

Introduction

Kosuke Hirano is an inventor based in Kariya, Japan, associated with Aisin Seiki Kabushiki Kaisha. His recorded patent focuses on evaluating camera-captured images through the analysis of synchronization signals.

Latest Patents

Hirano is associated with 1 patent, titled “Captured Image Decision Device.” The invention extracts vertical and horizontal synchronization signals used to display a camera-captured image. It measures the interval between vertical synchronization pulses and divides the displayed image frame into segment areas using a virtual horizontal line. The device then counts the horizontal synchronization pulses corresponding to each segment and determines whether the count meets or exceeds a predetermined threshold.

Career Highlights

Hirano’s patent work addresses image-display signal analysis, using pulse measurements to support decisions about captured images. His recorded company affiliation is Aisin Seiki Kabushiki Kaisha.

Collaborations

Hirano’s listed coworker is Norichika Yamashita. The available information identifies their association but does not specify a particular joint project.

Conclusion

Kosuke Hirano’s recorded invention applies synchronization-signal measurements to assess camera-captured images, reflecting his patent work associated with Aisin Seiki Kabushiki Kaisha.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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