Company Filing History:
Years Active: 2023-2025
Title: Innovations of Kong Aik Lee
Introduction
Kong Aik Lee is a prominent inventor based in Tokyo, Japan. He has made significant contributions to the field of signal processing, particularly through his innovative patents. With a total of 5 patents, his work focuses on advanced technologies that enhance the accuracy and efficiency of data processing.
Latest Patents
Kong Aik Lee's latest patents include a neural network-based signal processing apparatus and method, as well as a computer-readable storage medium. One of his notable inventions is a spoofing detection apparatus that features a multi-channel spectrogram creation unit and an evaluation unit. The multi-channel spectrogram creation unit extracts various types of spectrograms from speech data and integrates them to create a comprehensive multi-channel spectrogram. The evaluation unit then assesses this spectrogram by applying it to a classifier trained with labeled multi-channel spectrograms, effectively classifying the data as either genuine or spoofed. Another significant patent involves a similarity degree calculator and an authorization system, which calculates features for two sets of data and determines their similarity based on these features.
Career Highlights
Kong Aik Lee is currently employed at NEC Corporation, where he continues to push the boundaries of technology through his research and development efforts. His work has garnered attention for its practical applications in various industries, particularly in enhancing security measures in data processing.
Collaborations
Kong Aik Lee collaborates with talented individuals such as Qiongqiong Wang and Takafumi Koshinaka. Their combined expertise contributes to the innovative projects at NEC Corporation.
Conclusion
Kong Aik Lee's contributions to signal processing and his innovative patents demonstrate his commitment to advancing technology. His work not only enhances data processing capabilities but also plays a crucial role in improving security measures in various applications.