The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 25, 2025

Filed:

Mar. 27, 2020
Applicant:

Nec Corporation, Tokyo, JP;

Inventors:

Kosuke Akimoto, Tokyo, JP;

Seng Pei Liew, Tokyo, JP;

Ryo Mizushima, Tokyo, JP;

Kong Aik Lee, Tokyo, JP;

Assignee:

NEC CORPORATION, Tokyo, JP;

Primary Examiner:
Int. Cl.
CPC ...
G06F 21/32 (2013.01);
U.S. Cl.
CPC ...
G06F 21/32 (2013.01);
Abstract

A feature calculation means calculates N features for first data and N features for second data by using N feature functions for obtaining a feature for data on the basis of the data. A similarity degree calculation means calculates a similarity degree between the first data and the second data on the basis of the N features for the first data and the N features for the second data. Values of N features obtained when the same data is substituted into the N feature functions are different from each other.


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Akimoto, Kosuke. (2025). Similarity degree calculator, authorization system, similarity degree calculation method, similarity degree calculation program, and method for generating similarity degree calculation program (U.S. Patent No. 12235944). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12235944

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