Yokohama, Japan

Koki Tsujimoto

This inventor holds 1 USPTO granted patent. Top assignee: Nikon Corporation. Active years: 1995.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Koki Tsujimoto. Retrieved from https://idiyas.com/inventor/koki-tsujimoto

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 41(Granted Patents)


Company Filing History:


Years Active: 1995

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1 patent (USPTO):Explore Patents

Title: Koki Tsujimoto: Innovator in Light Wave Measurement Technology

Introduction

Koki Tsujimoto is a notable inventor based in Yokohama, Japan. He has made significant contributions to the field of distance measurement technology, particularly through his innovative patent.

Latest Patents

Koki Tsujimoto holds a patent for a light wave distance measuring apparatus. This apparatus is designed to enhance the accuracy of distance measurements by utilizing frequency dividing circuits to create a base intermediate frequency. This frequency is then outputted to a phase measuring circuit and a PLL reference frequency, which is a multiple of an integer of the base intermediate frequency. The design effectively prevents measurement errors caused by spurious components during phase measurement in light wave distance measurement.

Career Highlights

Koki Tsujimoto is associated with Nikon Corporation, a leading company in imaging and optical products. His work at Nikon has allowed him to focus on advancing technologies that improve measurement precision and reliability.

Collaborations

Koki Tsujimoto collaborates with Shigeru Aoki, contributing to the development of innovative solutions in their field.

Conclusion

Koki Tsujimoto's work in light wave distance measurement technology exemplifies the importance of innovation in enhancing measurement accuracy. His contributions continue to influence advancements in this critical area of technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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