Tokyo, Japan

Koji Tokuno


Average Co-Inventor Count = 3.1

ph-index = 2

Forward Citations = 57(Granted Patents)


Location History:

  • Loveland, CO (US) (2016)
  • Tokyo, JP (2005 - 2019)

Company Filing History:


Years Active: 2005-2019

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5 patents (USPTO):Explore Patents

Title: Koji Tokuno: Innovator in Measurement Technology

Introduction

Koji Tokuno is a prominent inventor based in Tokyo, Japan. He has made significant contributions to the field of measurement technology, holding a total of 5 patents. His work focuses on enhancing the accuracy and efficiency of measurement methods for electronic devices.

Latest Patents

Among his latest patents is the "Inter-terminal capacitance measurement method for three-terminal device and apparatus for the same." This invention provides a measurement apparatus and method capable of measuring inter-terminal capacitances of a three-terminal device with high reproducibility while canceling the influences of residual inductances. The apparatus includes a route selector with multiple terminals, an LCR meter, and various cables for connecting the device under test. Another notable patent is the "Power device analyzer," which is designed for analyzing power devices. This device analyzer features a collector supply that generates supply signal pulses with selected voltage or current levels, allowing for precise current regulation in the current path.

Career Highlights

Koji Tokuno has worked with leading companies in the technology sector, including Agilent Technologies, Inc. and Keysight Technologies, Inc. His experience in these organizations has contributed to his expertise in measurement technologies and power device analysis.

Collaborations

Throughout his career, Koji has collaborated with notable professionals in the field, including Yoshimi Nagai and Akihiko Goto. These collaborations have further enriched his work and innovations.

Conclusion

Koji Tokuno's contributions to measurement technology and his innovative patents reflect his dedication to advancing the field. His work continues to influence the development of more accurate and efficient measurement methods for electronic devices.

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