Tokyo, Japan

Koichi Sugimura

This inventor holds 1 USPTO granted patent. Top assignee: Kabushiki Kaisha Csk. Active years: 1991.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Koichi Sugimura. Retrieved from https://idiyas.com/inventor/koichi-sugimura

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 9(Granted Patents)


Company Filing History:


Years Active: 1991

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1 patent (USPTO):Explore Patents

Title: Koichi Sugimura: Innovator in Optical Recording Medium Inspection

Introduction

Koichi Sugimura is a prominent inventor based in Tokyo, Japan. He has made significant contributions to the field of optical recording technologies, particularly known for his innovative systems designed to inspect defects in optical recording media.

Latest Patents

Sugimura holds one patent that focuses on systems for inspecting defects in optical recording mediums. This invention plays a crucial role in enhancing the quality and reliability of optical media, contributing to the ongoing advancements in data storage solutions.

Career Highlights

Sugimura is affiliated with Kabushiki Kaisha CSK, a company recognized for its commitment to research and development in technology. His work there emphasizes his dedication to improving optical inspection systems, underlining his role as a leading inventor in this sector.

Collaborations

Throughout his career, Sugimura has collaborated with notable coworkers, including Fumio Kimura and Shigeru Izawa. These collaborations have allowed for a synergy of ideas and expertise, further driving innovation within their projects.

Conclusion

As a dedicated innovator, Koichi Sugimura continues to impact the field of optical recording technologies. His patent reflects a commitment to advancing quality assurance in optical media, showcasing the importance of inventions in enhancing technological capabilities.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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