Urawa, Japan

Koichi Shigeno

This inventor holds 1 USPTO granted patent. Top assignee: Asahi Denka Kogyo K.k.. Active years: 2002.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Koichi Shigeno. Retrieved from https://idiyas.com/inventor/koichi-shigeno-bfajn71v

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 2002

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1 patent (USPTO):Explore Patents

Title: Koichi Shigeno: Innovator in Thermal Recording Materials

Introduction

Koichi Shigeno is a notable inventor based in Urawa, Japan. He has made significant contributions to the field of thermal recording materials. His innovative work has led to the development of a patented technology that enhances the efficiency and quality of thermal recording processes.

Latest Patents

Koichi Shigeno holds a patent for a thermal recording material. This invention is crucial for various applications in printing and imaging technologies. His patent demonstrates his commitment to advancing the capabilities of thermal recording systems.

Career Highlights

Shigeno is currently employed at Asahi Denka Kogyo K.K., where he continues to innovate and develop new technologies. His work at the company has positioned him as a key player in the field of thermal materials. With a focus on quality and performance, he has contributed to the company's reputation for excellence.

Collaborations

Throughout his career, Koichi Shigeno has collaborated with talented individuals such as Mitsuo Akutsu and Nobuhide Tominaga. These partnerships have fostered a creative environment that encourages innovation and the sharing of ideas.

Conclusion

Koichi Shigeno's contributions to thermal recording materials highlight his role as an influential inventor in the industry. His work continues to impact the field positively, showcasing the importance of innovation in technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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