Koichi Nishine

Title: Innovations by Koichi Nishine in Surface Inspection Technology

Introduction

Koichi Nishine is an accomplished inventor based in Westford, MA, known for his significant contributions to surface inspection technology. With a total of two patents to his name, Nishine has developed innovative methods that enhance the detection of surface defects, which are crucial in various manufacturing processes.

Latest Patents

Nishine's latest patents include a "Surface Defect Detection and Confirmation System and Method" and a "Surface Pit Detection System and Method." The first patent describes a technique where a beam of radiation is directed at a surface to be inspected. The scattered radiation is sensed in two regions: the near-specular region, which indicates a pit, and the far-specular region, which indicates a flaw. By normalizing the signals from these regions, the system can accurately identify defects as opposed to contamination. The second patent focuses on uniquely detecting pits on smooth surfaces by irradiating the area and separately sensing the scattered radiation. This method also involves normalizing the near-specular signal with respect to the far-specular signal to indicate the presence of pits.

Career Highlights

Nishine has made a notable impact in the field of optics and surface inspection through his work at Qc Optics, Inc. His innovative approaches have paved the way for advancements in quality control and defect detection in various industries.

Collaborations

Throughout his career, Nishine has collaborated with talented individuals such as George S. Quackenbos and Jay L. Ormsby. These collaborations have contributed to the development of his patented technologies and have fostered a creative environment for innovation.

Conclusion

Koichi Nishine's work in surface inspection technology exemplifies the importance of innovation in enhancing manufacturing processes. His patents reflect a commitment to improving quality control through advanced detection methods.