Soka, Japan

Koich Tanaka

This inventor holds 1 USPTO granted patent. Top assignee: Pentel Kabushiki Kaisha. Active years: 1976.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Koich Tanaka. Retrieved from https://idiyas.com/inventor/koich-tanaka-vspxefs9

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 1976

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1 patent (USPTO):Explore Patents

Title: Koich Tanaka: Inventor of a Response Analyzer.

Introduction

Koich Tanaka is an inventor associated with Soka, Japan. His recorded patent work includes a response analyzer designed to process signals from multiple answering devices.

Latest Patents

The available information identifies one patent for Tanaka: “Response analyzer.” The invention receives multiple frequency signals simultaneously and converts them into time-divided pulses. Counting those pulses indicates how many answering devices responded, while associated AND gates sample the pulses to identify which devices responded. The system creates the time-divided pulses by mixing the received signals with a continuously and periodically varied local oscillator signal, converting them to intermediate frequencies, and extracting a fixed-frequency component. Tanaka is credited with 1 patent.

Career Highlights

Tanaka is associated with Pentel Kabushiki Kaisha. His patent describes a signal-processing approach for detecting and distinguishing responses from multiple devices.

Collaborations

The provided information lists Genichi Tagata and Kiyomi Abe as Tanaka’s coworkers. It does not specify their roles in the patent or whether they collaborated on the invention.

Conclusion

Koich Tanaka’s recorded invention, the “Response analyzer,” addresses the simultaneous detection and identification of responses from multiple answering devices.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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