Chiba, Japan

Kohsuke Tsunashima

This inventor holds 1 USPTO granted patent. Top assignee: Ricoh Company, Ltd.. Active years: 2009.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Kohsuke Tsunashima. Retrieved from https://idiyas.com/inventor/kohsuke-tsunashima

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 13(Granted Patents)


Company Filing History:


Years Active: 2009

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1 patent (USPTO):Explore Patents

Title: Kohsuke Tsunashima: Innovator in Abnormality Diagnosis

Introduction

Kohsuke Tsunashima is a notable inventor based in Chiba, Japan. He has made significant contributions to the field of image forming technology. His work focuses on enhancing the reliability of abnormality diagnosis in image forming apparatuses.

Latest Patents

Tsunashima holds a patent for an "Abnormality diagnosing method, condition appraisal apparatus, image forming apparatus, management apparatus and management system." This innovative method allows for a highly reliable abnormality diagnosis of an image forming apparatus to be initiated immediately after the delivery of the device to the user. He has 1 patent to his name.

Career Highlights

Kohsuke Tsunashima is currently employed at Ricoh Company, Ltd., a leading company in imaging and electronics. His work at Ricoh has allowed him to develop and refine technologies that improve user experience and operational efficiency.

Collaborations

Throughout his career, Tsunashima has collaborated with esteemed colleagues such as Kunio Hasegawa and Yasuhiko Saka. These partnerships have fostered innovation and contributed to the advancement of technology in their field.

Conclusion

Kohsuke Tsunashima is a dedicated inventor whose work in abnormality diagnosis has made a significant impact in the imaging industry. His contributions continue to enhance the reliability and efficiency of image forming apparatuses.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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