Kanagawa, Japan

Kohei Oyu

This inventor holds 2 USPTO granted patents and 2 published patent applications. Top assignee: Canon Kabushiki Kaisha. Active years: 2025-2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Kohei Oyu. Retrieved from https://idiyas.com/inventor/kohei-oyu

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 2 

% Patents Active = 50.0

Average Co-Inventor Count = 11.0

ph-index = 1


Company Filing History:


Years Active: 2025-2026

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2 patents (USPTO):Explore Patents

Title: Innovations of Kohei Oyu in Sensor Technology

Introduction: Kohei Oyu is a notable inventor based in Kanagawa, Japan. He has made significant contributions to the field of sensor technology. His innovative work has led to the development of a unique sensor that enhances product detection capabilities.

Latest Patents: Kohei Oyu holds 1 patent for a sensor, device, system, and manufacturing method for a product. This sensor includes a structure and a detector, where the detector is designed to detect deformation of the structure. The structure consists of at least four elastic sections, which are discretely arranged in an imaginary plane.

Career Highlights: Oyu's career is marked by his association with Canon Kabushiki Kaisha, a leading company in imaging and optical products. His work at Canon has allowed him to focus on advancing sensor technology and its applications in various products.

Collaborations: Throughout his career, Kohei Oyu has collaborated with talented individuals such as Satoshi Mashiko and Haruhiko Horiguchi. These collaborations have fostered innovation and contributed to the development of cutting-edge technologies.

Conclusion: Kohei Oyu's contributions to sensor technology exemplify the spirit of innovation. His work continues to influence the field and inspire future advancements in product detection systems.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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