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For the Inventor, By the Inventor

Utsunomiya, Japan

Kohei Maeda

This inventor holds 6 USPTO granted patents. Top assignee: Canon Kabushiki Kaisha. Active years: 2001-2022.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Kohei Maeda. Retrieved from https://idiyas.com/inventor/kohei-maeda

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 6

% Patents Active = 50.0

Average Co-Inventor Count = 2.0

ph-index = 4

Forward Citations = 45(Granted Patents)


Location History:

  • Toride, JP (2001)
  • Utsunomiya, JP (2004 - 2022)

Company Filing History:

goldMedal6 out of 92,994 
 
Canon Kabushiki Kaisha
 patents

Years Active: 2001-2022

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6 patents (USPTO):Explore Patents
1. 11513082 - Foreign substance inspection apparatus and foreign substance inspection method (2022-11-29),
2. 8339568 - Foreign particle inspection apparatus, exposure apparatus, and method of manufacturing device (2012-12-25),
3. 7498596 - Exposure method that obtains, prior to exposure, reticle surface form data and measurement position error, for scanning control (2009-03-03),
4. 6738128 - Exposure apparatus (2004-05-18),
5. 6185381 - Image forming apparatus (2001-02-06),
6. 6177977 - Image forming apparatus and controlling method thereof (2001-01-23),

Title: Kohei Maeda: Innovator in Foreign Substance Inspection Technology

Introduction

Kohei Maeda is a prominent inventor based in Utsunomiya, Japan. He has made significant contributions to the field of foreign substance inspection technology. With a total of 6 patents to his name, Maeda's work has advanced the capabilities of inspection apparatuses used in various industries.

Latest Patents

Maeda's latest patents include a foreign substance inspection apparatus and method. This apparatus inspects the presence or absence of foreign substances on objects that have both inspection and non-inspection regions. The system utilizes a sensor to illuminate the object and outputs an image that detects light from the inspection region. A processor then identifies foreign substances by analyzing the inspection region image while excluding the non-inspection region image. The non-inspection region image consists of two parts: the first part generated by light from a predetermined area and the second part, which has pixel values continuous from the first part. The processor specifies the second part based on this continuity.

Another notable patent is the foreign particle inspection apparatus, which includes a light projecting unit and a photo-receiving unit that captures scattered light. The photo-receiving unit is positioned at a tilt, allowing for the determination of foreign particles based on outputs in different states of polarization. This innovative approach enhances the accuracy of foreign particle detection.

Career Highlights

Kohei Maeda is currently employed at Canon Kabushiki Kaisha, a leading company in imaging and optical products. His work at Canon has allowed him to develop cutting-edge technologies that improve inspection processes across various applications.

Collaborations

Maeda has collaborated with notable coworkers, including Takashi Nakahara and Hitoshi Ueki. Their combined expertise has contributed to the successful development of advanced inspection technologies.

Conclusion

Kohei Maeda's contributions to foreign substance inspection technology demonstrate his innovative spirit and dedication to improving industrial processes. His patents reflect a commitment to enhancing the accuracy and efficiency of inspection systems.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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