Weil im Schoenbuch, Germany

Knut Schuenemann

USPTO Granted Patents = 1 

Average Co-Inventor Count = 1.0


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: Knut Schuenemann: Innovator in Microelectronic Chip Technology

Introduction

Knut Schuenemann is a notable inventor based in Weil im Schönbuch, Germany. He has made significant contributions to the field of microelectronics, particularly in the area of voltage management within microelectronic chips. His innovative techniques have the potential to enhance the performance and reliability of electronic devices.

Latest Patents

Knut Schuenemann holds a patent for a method aimed at reducing voltage drooping in microelectronic chips. The patent discloses techniques that involve separating a scan data launch clock from a capture clock, utilizing a variable time delay that depends on the delay of a succeeding scan path of the latches. This method is designed to improve the efficiency of data processing in microelectronic systems. The techniques also include analyzing and categorizing latches against the time delay into dedicated buffer group categories, as well as assigning local clock buffers to the latches within these categories. This innovation is crucial for enhancing the performance of microelectronic devices.

Career Highlights

Knut Schuenemann is associated with the International Business Machines Corporation, commonly known as IBM. His work at IBM has allowed him to collaborate with other talented professionals in the field, contributing to advancements in microelectronic technology.

Collaborations

Knut has worked alongside notable colleagues such as Hagen Schmidt and Andreas H A Arp. Their collaborative efforts have furthered the development of innovative solutions in microelectronics.

Conclusion

Knut Schuenemann's contributions to the field of microelectronics, particularly through his patent on reducing voltage drooping in microelectronic chips, highlight his role as an influential inventor. His work continues to impact the efficiency and reliability of electronic devices.

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