Birker.o slashed.d, Denmark

Knut Conradsen

This inventor holds 1 USPTO granted patent. Top assignee: Eskofot A/s. Active years: 1999.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Knut Conradsen. Retrieved from https://idiyas.com/inventor/knut-conradsen

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 71(Granted Patents)


Company Filing History:


Years Active: 1999

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1 patent (USPTO):Explore Patents

Title: Knut Conradsen - Innovating Estimation Methods

Introduction

Knut Conradsen is an accomplished inventor based in Birkerød, Denmark. Known for his innovative approach to estimation methods, he has made a significant contribution to the field through his intellectual property.

Latest Patents

Knut holds a patent titled "Method of Estimation," which reflects his expertise in developing advanced techniques for more accurate assessments in various applications. This patent showcases his ability to combine technical knowledge with practical solutions.

Career Highlights

Knut is currently employed at Eskofot A/S, a company recognized for its contributions to imaging and estimation technologies. Throughout his career, he has focused on enhancing methodologies that streamline processes and improve accuracy.

Collaborations

In his professional journey, Knut has collaborated with notable coworkers such as Michael Grunkin and Knud Erik Fredfeldt. These collaborations have enriched his work, addressing complex challenges in the field and fostering a culture of innovation within his team.

Conclusion

Knut Conradsen's work exemplifies the spirit of innovation that drives advancements in estimation methodologies. His patent, along with his collaborations and contributions at Eskofot A/S, underscore his role as a key figure in the field, contributing to ongoing technological advancements.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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