Ehningen, Germany

Klaus Steininger

This inventor holds 1 USPTO granted patent, plus 1 CIPO patent and 2 EPO patents. Top assignee: Acterna Eningen Gmbh. Active years: 2003.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Klaus Steininger. Retrieved from https://idiyas.com/inventor/klaus-steininger

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile



 

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 3(Granted Patents)


Company Filing History:


Years Active: 2003

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1 patent (USPTO):Explore Patents

Title: Klaus Steininger: Innovator in Optical Spectrum Analysis

Introduction

Klaus Steininger is a notable inventor based in Eningen, Germany. He has made significant contributions to the field of optical spectrum analysis, particularly through his innovative patent. His work has implications for various industries that rely on precise optical measurements.

Latest Patents

Klaus Steininger holds a patent for "Spectral bandwidth calibration of an optical spectrum analyzer." This invention focuses on determining the respective wavelength bandwidths of an optical spectrum analyzer at the wavelengths of reference lines. The calibration data derived from this process is essential for establishing measurement tolerances using reference lines with known wavelengths and bandwidths.

Career Highlights

Throughout his career, Klaus has worked with prominent companies such as Acterna Eningen GmbH and Marelli Automotive Lighting Reutlingen GmbH. His experience in these organizations has allowed him to apply his expertise in optical technologies and contribute to advancements in the field.

Collaborations

Klaus has collaborated with talented individuals, including Thomas Fuhrmann and Markus Horbelt. These partnerships have fostered innovation and have been instrumental in the development of his patented technologies.

Conclusion

Klaus Steininger is a distinguished inventor whose work in optical spectrum analysis has paved the way for advancements in measurement technologies. His contributions continue to influence the industry and inspire future innovations.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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