Klaus Korner

Title: Klaus Korner - Innovator in Surface Measurement Technology

Introduction

Klaus Korner is a notable inventor based in Berlin, Germany. He has made significant contributions to the field of surface measurement technology, particularly through his innovative patent.

Latest Patents

Klaus Korner holds a patent for a "Method and system for measuring the microstructure of surfaces." This invention relates to a method and a system for measuring the microstructure of technical surfaces based on the principle of the interference microscope. The invention involves imaging the virtual planes of reflection present in the object beam space and reference beam space in an optically conjugated manner by different offsets. It separates the point at which the beam is split and the point where it is recombined in space, allowing for a correction that ensures the object beam and reference beam propagate parallel to one another in a common beam space. This method effectively eliminates undesired circular interference structures and removes the need for any physical reference surface in interferometric measurement.

Career Highlights

Klaus Korner is associated with the Akademie der Wissenschaften der DDR, where he has been able to apply his expertise in surface measurement technology. His work has been instrumental in advancing the understanding and measurement of microstructures in various technical applications.

Collaborations

Klaus Korner has collaborated with Holger Fritz, contributing to the development and refinement of measurement techniques in their field.

Conclusion

Klaus Korner's innovative approach to measuring surface microstructures has made a significant impact in the field of technical surface analysis. His contributions continue to influence advancements in measurement technology.