This inventor holds 1 USPTO granted patent. Top assignee: Veb Kombinat Polygraph 'Werner Lamberz Leipzig'. Active years: 1984.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 1984
Title: Klaus Fritzsche: Innovator in Adhesive Layer Measurement
Introduction
Klaus Fritzsche is a notable inventor based in Leipzig, Germany. He has made significant contributions to the field of adhesive technology, particularly in the measurement of adhesive layers. His innovative approach has led to the development of a unique process that enhances the accuracy of adhesive layer thickness determination.
Latest Patents
Klaus Fritzsche holds a patent for a process titled "Process for the determination of thickness of adhesive layers of inner." This invention focuses on a method for determining the thickness of adhesive layers applied to book block backings. The process involves measuring the position of a backing before adhesive application to establish a reference point. After applying the adhesive, the position of the backing is measured again to ascertain the thickness of the adhesive layer. The method recommends taking two measurements before and after adhesive application, with the readings averaged to provide a mean thickness. Laser beam technology, aided by a beam splitter, is preferred for these measurements.
Career Highlights
Klaus Fritzsche has worked at VEB Kombinat Polygraph "Werner Lamberz Leipzig," where he has been instrumental in advancing adhesive measurement techniques. His work has not only contributed to the efficiency of adhesive applications but has also set a standard in the industry for precision and reliability.
Collaborations
Throughout his career, Klaus has collaborated with notable colleagues such as Frank Schumann and Hans-Jurgen Richter. These partnerships have fostered an environment of innovation and have led to further advancements in adhesive technology.
Conclusion
Klaus Fritzsche's contributions to adhesive layer measurement exemplify the importance of innovation in industrial applications. His patented process represents a significant advancement in the field, showcasing his dedication to improving adhesive technology.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile