Danderyd, Sweden

Kjell Lindström

This inventor holds 2 USPTO granted patents. Top assignee: Flir Systems Ab. Active years: 2003.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Kjell Lindström. Retrieved from https://idiyas.com/inventor/kjell-lindstrandoumlm

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 6.0

ph-index = 2

Forward Citations = 9(Granted Patents)


Company Filing History:


Years Active: 2003

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2 patents (USPTO):Explore Patents

Title: The Innovations of Kjell Lindström

Introduction

Kjell Lindström is a notable inventor based in Danderyd, Sweden. He has made significant contributions to the field of technology, particularly in the development of infrared camera systems. With a total of two patents to his name, Lindström's work has had a meaningful impact on the industry.

Latest Patents

Lindström's latest patents include an "Infrared camera including a slave monitor with system control" and an "Infrared camera." These innovations showcase his expertise in imaging technology and his commitment to advancing the capabilities of infrared systems.

Career Highlights

Kjell Lindström is currently employed at FLIR Systems AB, a company renowned for its thermal imaging and infrared camera technology. His role at FLIR Systems AB has allowed him to work on cutting-edge projects that push the boundaries of what is possible in infrared imaging.

Collaborations

Throughout his career, Lindström has collaborated with talented individuals such as Tomas Lannestedt and Lars Heimer. These partnerships have fostered a creative environment that has led to the successful development of innovative technologies.

Conclusion

Kjell Lindström's contributions to the field of infrared technology are commendable. His patents and work at FLIR Systems AB highlight his dedication to innovation and excellence in engineering.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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