This inventor holds 1 USPTO granted patent. Top assignee: Other. Active years: 2003.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2003
Title: Kiyoshi Oka: Innovator in Surface Geometry Measurement
Introduction
Kiyoshi Oka is a notable inventor based in Ibaraki, Japan. He has made significant contributions to the field of measurement technology, particularly with his innovative approach to surface geometry measurement.
Latest Patents
Kiyoshi Oka holds a patent for a "Baseline length variable surface geometry measuring apparatus and range finder." This apparatus utilizes triangulation to measure the distance to an object from a sensor head that includes projection optics and observation optics. The projection optics feature a drive mechanism that adjusts the laser beam's projecting position or the baseline length. The distance to the object is calculated by measuring the baseline length when the laser light forms a focused image on the observation plane. The apparatus is designed to withstand extreme environments, including high temperatures and high radiation, and can also function as a range finder.
Career Highlights
Throughout his career, Kiyoshi Oka has demonstrated a commitment to advancing measurement technologies. His innovative designs have paved the way for more accurate and reliable measurement systems in various applications.
Collaborations
Kiyoshi Oka has collaborated with notable colleagues, including Satoru Takahashi and Eisuke Tada. Their combined expertise has contributed to the development of advanced measurement technologies.
Conclusion
Kiyoshi Oka's contributions to the field of surface geometry measurement highlight his innovative spirit and dedication to technology. His patent for the surface geometry measuring apparatus showcases his ability to create solutions that withstand challenging conditions.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile