Tokyo, Japan

Kiyoshi Mukai

This inventor holds 1 USPTO granted patent. Top assignee: Nec Corporation. Active years: 2010.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Kiyoshi Mukai. Retrieved from https://idiyas.com/inventor/kiyoshi-mukai-pnvsaems

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 7.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2010

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1 patent (USPTO):Explore Patents

Title: Kiyoshi Mukai: Innovator in Chromosome Evaluation Technology

Introduction

Kiyoshi Mukai is a notable inventor based in Tokyo, Japan. He has made significant contributions to the field of cellular biology through his innovative patent. His work focuses on evaluating chromosome states, which is crucial for understanding various cellular processes.

Latest Patents

Kiyoshi Mukai holds a patent for a method of evaluating chromosome states and an evaluation system. This method involves assessing a cell's state based on images taken of a cell containing a chromosome territory. The process includes extracting the chromosome territory from the image, standardizing its positioning state, quantifying this state, and ultimately evaluating the cell state based on the quantified data.

Career Highlights

Mukai is associated with NEC Corporation, where he applies his expertise in cellular evaluation technologies. His work at NEC has allowed him to contribute to advancements in biological research and technology.

Collaborations

He has collaborated with notable colleagues such as Tomoharu Kiyuna and Kenji Okajima, enhancing the research and development efforts within his field.

Conclusion

Kiyoshi Mukai's innovative approach to evaluating chromosome states represents a significant advancement in cellular biology. His contributions continue to influence research and technology in this important area.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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