Nagano, Japan

Kiyohito Aoki

This inventor holds 1 USPTO granted patent. Top assignee: Fujikoshi Machinery Corp.. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Kiyohito Aoki. Retrieved from https://idiyas.com/inventor/kiyohito-aoki

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: Kiyohito Aoki: Innovator in Wafer Measurement Technology

Introduction

Kiyohito Aoki is a notable inventor based in Nagano, Japan. He has made significant contributions to the field of semiconductor technology, particularly in the measurement of wafer thickness. His innovative approach has led to the development of a unique non-contact apparatus that enhances precision in this critical area of manufacturing.

Latest Patents

Aoki holds a patent for a non-contact apparatus for measuring wafer thickness. This advanced device includes a monolithic wavelength sweeping semiconductor laser light source, which is integral to its operation. The apparatus features a laser control unit that manages the laser source, a processor for controlling the oscillation of laser light, and an optical system that directs the laser onto the wafer. Additionally, it incorporates a detection unit for capturing interference light signals, an A/D converter for digital signal conversion, and a calculation unit that determines the wafer's thickness by analyzing the digital signals. This innovative technology allows for precise measurements without direct contact, thereby preserving the integrity of the wafer.

Career Highlights

Kiyohito Aoki is associated with Fujikoshi Machinery Corporation, where he has been instrumental in advancing wafer measurement technologies. His work has not only contributed to the company's reputation but has also positioned him as a key figure in the semiconductor industry. Aoki's patent reflects his commitment to innovation and excellence in engineering.

Collaborations

Aoki has collaborated with talented colleagues such as Chihiro Miyagawa and Kazutaka Shibuya. Their combined expertise has fostered an environment of creativity and innovation, leading to advancements in their respective fields.

Conclusion

Kiyohito Aoki's contributions to wafer measurement technology exemplify the spirit of innovation. His patented non-contact apparatus represents a significant advancement in semiconductor manufacturing, showcasing his dedication to improving precision and efficiency in the industry.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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