This inventor holds 1 USPTO granted patent. Top assignees: Idemitsu Kosan Company, Limited, Japan Industrial Testing Corporation. Active years: 2011.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:

Years Active: 2011
Title: Kiyohazu Fujimaki: Innovator in Electromagnetic Ultrasonic Flaw Detection
Introduction
Kiyohazu Fujimaki is a notable inventor based in Osaka, Japan. He has made significant contributions to the field of flaw detection technology, particularly through his innovative methods and devices. His work focuses on enhancing the accuracy and efficiency of inspections in various industrial applications.
Latest Patents
Fujimaki holds a patent for an "Electromagnetic ultrasonic flaw detection method and electromagnetic ultrasonic transducer to be used therefor." This method ensures highly accurate inspection of the interior surface of fin-implanted heat transfer tubes for corrosion detection. It requires less time for inspection, eliminates the need for contact mediums such as water, and reduces both time and costs associated with pretreatment. The method involves moving an Electromagnetic Acoustic Transducer (EMAT) axially within the tube, generating an axially symmetric SH wave through electromagnetic force, and detecting resonant frequencies to identify corroded portions of the tube body.
Career Highlights
Throughout his career, Kiyohazu Fujimaki has worked with prominent companies, including Idemitsu Kosan Company, Limited and Japan Industrial Testing Corporation. His experience in these organizations has allowed him to refine his expertise in flaw detection technologies and contribute to advancements in the field.
Collaborations
Fujimaki has collaborated with notable colleagues such as Hirotsugu Ogi and Masahiro Hirao. These partnerships have fostered innovation and development in the technologies related to electromagnetic ultrasonic flaw detection.
Conclusion
Kiyohazu Fujimaki's contributions to the field of flaw detection through his patented methods demonstrate his commitment to innovation and excellence. His work continues to impact the industry positively, ensuring safer and more efficient inspection processes.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile