Tsukuba, Japan

Kiwako Sakabe

This inventor holds 1 USPTO granted patent. Top assignee: Other. Active years: 2015.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Kiwako Sakabe. Retrieved from https://idiyas.com/inventor/kiwako-sakabe

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 2.0

ph-index = 1


Company Filing History:

goldMedal1 out of 834,601 
Other
 patents

Years Active: 2015

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1 patent (USPTO):Explore Patents

Title: Kiwako Sakabe: Innovator in X-ray Technology

Introduction

Kiwako Sakabe is a notable inventor based in Tsukuba, Japan. She has made significant contributions to the field of X-ray technology. Her innovative approach has led to the development of a unique method for generating X-rays.

Latest Patents

Kiwako Sakabe holds a patent for an X-ray generating method and apparatus. This method involves several steps, including the placement of a target within a chamber. An electron beam is then irradiated onto the target from a source, ensuring that the incident angle of the electron beam meets specific criteria. The process allows for the generation and extraction of X-rays from the target, adhering to defined output angle relations.

Career Highlights

Throughout her career, Kiwako has focused on advancing X-ray generation techniques. Her work has been instrumental in enhancing the efficiency and effectiveness of X-ray applications. She has demonstrated a commitment to innovation in her field.

Collaborations

Kiwako Sakabe has collaborated with her coworker, Noriyoshi Sakabe, to further her research and development efforts. Their partnership has contributed to the success of their projects and the advancement of X-ray technology.

Conclusion

Kiwako Sakabe is a pioneering inventor whose work in X-ray technology has made a lasting impact. Her innovative methods and dedication to her field continue to inspire advancements in medical and industrial applications.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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