Berlin, Germany

Kirsten Beyer

This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: Icahn School of Medicine at Mount Sinai. Active years: 2011.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Kirsten Beyer. Retrieved from https://idiyas.com/inventor/kirsten-beyer

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0


Average Co-Inventor Count = 2.0

ph-index = 1


Company Filing History:


Years Active: 2011

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1 patent (USPTO):Explore Patents

Title: Kirsten Beyer: Innovator in Allergy Diagnosis and Therapy

Introduction

Kirsten Beyer is a prominent inventor based in Berlin, Germany. She has made significant contributions to the field of allergy diagnosis and therapy, particularly concerning hazelnut-induced systemic reactions. Her innovative work has the potential to improve the lives of individuals affected by such allergies.

Latest Patents

Kirsten Beyer holds a patent for a "Method for diagnosis and therapy of hazelnut-induced systemic reaction." This invention is directed towards methods for predicting or diagnosing a hazelnut-induced systemic reaction, as well as for treating such reactions. She has 1 patent to her name, showcasing her expertise in this specialized area.

Career Highlights

Kirsten Beyer is affiliated with the Icahn School of Medicine at Mount Sinai, where she continues her research and development in allergy-related therapies. Her work is recognized for its impact on medical science and patient care.

Collaborations

Kirsten collaborates with Hugh A. Sampson, a notable figure in the field of allergy research. Their partnership enhances the quality and scope of their research endeavors.

Conclusion

Kirsten Beyer is a trailblazer in the field of allergy diagnosis and therapy, with her innovative methods paving the way for advancements in medical treatment. Her contributions are invaluable to the scientific community and those affected by allergies.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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