Chittoor, India

Kiran Kumar Dudala

This inventor holds 1 USPTO granted patent. Top assignee: Emc Corporation. Active years: 2014.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Kiran Kumar Dudala. Retrieved from https://idiyas.com/inventor/kiran-kumar-dudala

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 7(Granted Patents)


Company Filing History:


Years Active: 2014

Loading Chart...
1 patent (USPTO):Explore Patents

Title: Kiran Kumar Dudala and Automated Testing for Distributed Systems.

Introduction

Kiran Kumar Dudala is an inventor associated with Chittoor, India. His patent work addresses automated testing and data recovery in distributed systems. He is associated with EMC Corporation.

Latest Patents

Dudala is credited with 1 patent: “Automated Time-Based Testing Method for Distributed System.” The disclosure describes coordinating backup and recovery schedules across a server and a client. A server scheduler sets the backup schedule, while a client scheduler sets the recovery schedule. The client uses a data simulation to generate data and a repository to store data attributes and backup metadata. According to the schedules, backup scripts capture the simulated data, and recovery scripts restore it on the client.

Career Highlights

The patent reflects work on automating time-based backup and recovery testing for distributed systems. Its approach combines scheduling, simulated data generation, metadata, and scripts to exercise backup and restoration processes.

Collaborations

Dudala’s listed coworkers include Subramanian Nallasivam and Krishna Chandra.

Conclusion

Kiran Kumar Dudala’s patent focuses on a coordinated method for testing backup and recovery workflows in distributed systems.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…