De Pere, WI, United States of America

Kimmo Antero Ukkola

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Pdq Manufacturing. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Kimmo Antero Ukkola. Retrieved from https://idiyas.com/inventor/kimmo-antero-ukkola

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Kimmo Antero Ukkola: Vehicle Treatment System Inventor.

Introduction

Kimmo Antero Ukkola is an inventor associated with De Pere, Wisconsin, and Pdq Manufacturing. His work includes a patented system designed to detect the positional status of a vehicle treatment device.

Latest Patents

Ukkola’s listed patent is “Vehicle Treatment System with Positional Status Detection Mechanism.” The invention uses proximity sensors mounted on a support structure and a flag fixed to the rotating treatment device. As the device moves through a predetermined range, the flag activates the sensors in an expected sequence to indicate its orientation. If an external force, impact, or other deviation causes unexpected movement, the sensor activations can reveal the change in position. Ukkola is credited with 1 patent.

Career Highlights

Ukkola’s patent reflects an engineering focus on monitoring the position of vehicle treatment equipment and detecting unexpected movement. The listed company associated with his work is Pdq Manufacturing.

Collaborations

Daniel Ervin Moldenhauer is identified as Ukkola’s coworker. The available information does not specify their particular projects or contributions together.

Conclusion

Kimmo Antero Ukkola’s patented system applies sensor-based position detection to vehicle treatment equipment, helping identify when a device moves differently than expected.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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