Naju, South Korea

Ki Won Lee

This inventor holds 1 USPTO granted patent. Top assignee: Chonnam National University. Active years: 2016.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Ki Won Lee. Retrieved from https://idiyas.com/inventor/ki-won-lee-pule8tpc

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 5.0

ph-index = 1


Company Filing History:


Years Active: 2016

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1 patent (USPTO):Explore Patents

Title: Ki Won Lee: Innovator in Sandwich Panel Manufacturing

Introduction

Ki Won Lee is a notable inventor based in Naju, South Korea. He has made significant contributions to the field of manufacturing, particularly in the development of innovative methods for creating sandwich panels. His work is characterized by a focus on efficiency and structural integrity.

Latest Patents

Ki Won Lee holds a patent for a "Method for manufacturing sandwich panel having core of truss structure." This invention provides a method for manufacturing a panel that includes a core with a truss structure situated between upper and lower face sheets. The manufacturing process involves positioning the upper and lower face sheets in parallel at a predetermined distance. It includes a series of steps where flexible wires are used to connect the face sheets, ensuring they remain parallel while maximizing vertical spacing.

Career Highlights

Ki Won Lee is affiliated with Chonnam National University, where he contributes to research and development in manufacturing technologies. His expertise in sandwich panel manufacturing has positioned him as a key figure in this area of innovation.

Collaborations

Some of his notable coworkers include A Reum Kim and Ki Ju Kang, who collaborate with him on various projects related to manufacturing and engineering.

Conclusion

Ki Won Lee's innovative approach to sandwich panel manufacturing exemplifies the importance of creativity in engineering. His contributions continue to influence the field and inspire future advancements.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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