Seoul, South Korea

Ki-Sub Lim

This inventor holds 1 USPTO granted patent. Top assignee: Samsung Electronics Co., Ltd.. Active years: 2017.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Ki-Sub Lim. Retrieved from https://idiyas.com/inventor/ki-sub-lim-ctrwzgvr

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1


Company Filing History:


Years Active: 2017

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1 patent (USPTO):Explore Patents

Title: The Innovations of Ki-Sub Lim

Ki-Sub Lim is a notable inventor based in Seoul, South Korea. He has made significant contributions to the field of probing methods in electronics. His work primarily focuses on enhancing the efficiency and accuracy of testing circuit substrates.

Latest Patents

Ki-Sub Lim holds a patent for a probing method, probe card for performing the method, and probing apparatus including the probe card. This innovative probing method involves setting an allowable temperature range that includes a test temperature. It ensures contact between a pad of a circuit substrate and a needle of a probe card. The method provides the probe card with a temperature within the allowable range, allowing for effective testing of the circuit substrate by supplying a test current through the needle.

Career Highlights

Ki-Sub Lim is currently employed at Samsung Electronics Co., Ltd., a leading company in the electronics industry. His work at Samsung has allowed him to develop and refine his innovative probing techniques, contributing to the company's advancements in technology.

Collaborations

One of his notable collaborators is Sang-Boo Kang. Their partnership has fostered a creative environment that encourages innovation and the development of new technologies.

Conclusion

Ki-Sub Lim's contributions to the field of probing methods demonstrate his commitment to advancing technology in electronics. His innovative approaches continue to influence the industry and pave the way for future developments.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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